Interferometric method for deformation measurement of structures in industry
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Published:2003-07-01
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ISSN:0277-786X
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Container-title:Photonics, Devices, and Systems II
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language:
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Author:
Miks Antonin,Novak Jiri
Cited by
1 articles.
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1. Colorimetric method for phase evaluation;Journal of the Optical Society of America A;2006-04-01