Identification of in-field defect development in digital image sensors

Author:

Dudas Jozsef,Wu Linda M.,Jung Cory,Chapman Glenn H.,Koren Zahava,Koren Israel

Publisher

SPIE

Cited by 14 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Image Degradation in Time Due to Interacting Hot Pixels;2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2023-10-03

2. Effects of Image Compression on Image Age Approximation;Digital Forensics and Watermarking;2022

3. A machine learning-based approach for picture acquisition timeslot prediction using defective pixels;Forensic Science International: Digital Investigation;2021-12

4. Identification Of In-Field Sensor Defects In The Context Of Image Age Approximation;2021 IEEE International Conference on Image Processing (ICIP);2021-09-19

5. Assessment of Sensor Ageing-Impact in Air Travelled Fingerprint Capturing Devices;2021 International Conference of the Biometrics Special Interest Group (BIOSIG);2021-09

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