Using ellipsometry and x-ray photoelectron spectroscopy for real-time monitoring of the oxidation of aluminum mirrors protected by ultrathin MgF2 layers-Reference-Cited by-同舟云学术

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Using ellipsometry and x-ray photoelectron spectroscopy for real-time monitoring of the oxidation of aluminum mirrors protected by ultrathin MgF2 layers

Published:2019-09-09 Issue: Volume: Page:
ISSN:
Container-title:Astronomical Optics: Design, Manufacture, and Test of Space and Ground Systems II
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Author:

Johnson Brian I.,Avval Tahereh G.,Hodges Grant,Carver Victoria,Membreno Karen,Allred David D.,Linford Matthew R.

Publisher

SPIE

Reference37 articles.

1. Trends in the global aluminum fabrication industry

2. Aluminum applications in the rail industry;Skillingberg;Light Met. Age-Chicago,2007

3. Reflectance of evaporated aluminum in the vacuum ultraviolet;Hass;J. Opt. Soc. Am.,1956

4. Reflecting Coatings for the Extreme Ultraviolet*

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. In situ measurement of cavitation damage from single bubble collapse using high-speed chronoamperometry;Ultrasonics Sonochemistry;2023-01

2. Evidence that evaporated Al/AlF3 bilayer thin films stored in a 327 K oven for over 2500 hours have not degraded;Space Telescopes and Instrumentation 2022: Ultraviolet to Gamma Ray;2022-08-31

3. Oxidation of aluminum thin films protected by ultrathin MgF2 layers measured using spectroscopic ellipsometry and X-ray photoelectron spectroscopy;OSA Continuum;2021-02-25

4. Room temperature plasma-etching and surface passivation of far-ultraviolet Al mirrors using electron beam generated plasmas;Optical Materials Express;2021-02-11

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