Spectral thin-film interference observed with diffuse reflectance in a center-illuminated-central-acquired geometry indicates potential effects of the substrate scattering and absorption on the interference fringe-Reference-Cited by-同舟云学术

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Spectral thin-film interference observed with diffuse reflectance in a center-illuminated-central-acquired geometry indicates potential effects of the substrate scattering and absorption on the interference fringe

Published:2024-03-13 Issue: Volume:12 Page:30
ISSN:
Container-title:Optical Biopsy XXII: Toward Real-Time Spectroscopic Imaging and Diagnosis
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Author:

Piao Daqing,Farahzadi Nafiseh,Ramanathan Ranjith

Publisher

SPIE

Reference5 articles.

1. Effect of Substrate on Radiative Properties of Thin Films;Armaly,1904

2. Further Increasing the Accuracy of Characterization of a Thin Dielectric or Semiconductor Film on a Substrate from Its Interference Transmittance Spectrum;Minkov,2021

3. A method for measuring and calibrating the thickness of thin films based on infrared interference technology;Sun,2023

4. Center wavelength shift dependence on substrate coefficient of thermal expansion for optical thin-film interference filters deposited by ion-beam sputtering;Brown,2004

5. Laparoscopic diffuse reflectance spectroscopy of an underlying tubular inclusion: a phantom study;Piao,2019

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