Emissivity measurements for YSZ thermal barrier coating at high temperatures using a 1.6-μm single-wavelength pyrometer-Reference-Cited by-同舟云学术

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Emissivity measurements for YSZ thermal barrier coating at high temperatures using a 1.6-μm single-wavelength pyrometer

Published:1998-02-01 Issue:2 Volume:37 Page:683
ISSN:0091-3286
Container-title:Optical Engineering
language:en
Short-container-title:Opt. Eng

Author:

Alaruri Sami D.

Publisher

SPIE-Intl Soc Optical Eng

Subject

General Engineering,Atomic and Molecular Physics, and Optics

Cited by 21 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Development of An Apparatus for the Directional Spectral Emissivity Measurement from 50 ℃ to 1000 ℃;International Journal of Thermophysics;2024-06-21

2. Error of Measuring Surface Temperature of Turbine Blades With the Influence of Reflection by Monochromatic Method;IEEE Transactions on Instrumentation and Measurement;2023

3. Stresses within rare-earth doped yttria-stabilized zirconia thermal barrier coatings from in-situ synchrotron X-ray diffraction at high temperatures;Surface and Coatings Technology;2022-08

4. New directional spectral emissivity measurement apparatus simultaneously collecting the blackbody and sample radiation;Review of Scientific Instruments;2022-04-01

5. Measurements of spectral emissivity, reflectance and transmittance at high temperatures using laser heating and auxiliary light source;International Journal of Heat and Mass Transfer;2022-02

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