Toward augmenting tip-enhanced nanoscopy with optically resolved scanning probe tips

Author:

Belhassen Jeremy1,Glass Simcha1,Teblum Eti2,Stanciu George A.3,Tranca Denis E.3,Zalevsky Zeev4,Stanciu Stefan G.3,Karsenty Avi1

Affiliation:

1. Jerusalem College of Technology, Lev Academic Center, Faculty of Engineering, Department of Applied Physics/Electro-Optics Engineering, Advanced Laboratory of Electro-Optics, Jerusalem, Israel

2. Bar-Ilan University, The Nanotechnology Center, Ramat Gan, Israel

3. Politehnica University of Bucharest, Center for Microscopy-Microanalysis and Information Processing, Bucharest, Romania

4. Bar-Ilan University, Faculty of Engineering, Ramat Gan, Israel

Publisher

SPIE-Intl Soc Optical Eng

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