Characterization of thin films and their structures in surface plasmon resonance measurements-Reference-Cited by-同舟云学术

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Characterization of thin films and their structures in surface plasmon resonance measurements

Published:1995-09-01 Issue:9 Volume:34 Page:2581
ISSN:0091-3286
Container-title:Optical Engineering
language:en
Short-container-title:Opt. Eng

Author:

Korhonen Ilkka K.

Publisher

SPIE-Intl Soc Optical Eng

Subject

General Engineering,Atomic and Molecular Physics, and Optics

Cited by 21 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Dynamic measurement of an angular Goos–Hänchen shift at a surface plasmon resonance in liquid;Applied Optics;2023-10-26

2. Dielectric-Loaded Waveguides as Advanced Platforms for Diagnostics and Application of Transparent Thin Films;Langmuir;2021-03-08

3. A Simple Simulation of Surface Plasmon Resonance in The Kretschmann Configuration Using Google Sheets;Jurnal Pendidikan Fisika Indonesia;2020-12-20

4. Asymmetric flow field-flow fractionation coupled to surface plasmon resonance detection for analysis of therapeutic proteins in blood serum;Analytical and Bioanalytical Chemistry;2020-10-24

5. Subnanometer imaging and controlled dynamical patterning of thermocapillary driven deformation of thin liquid films;Light: Science & Applications;2019-08-28

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