Author:
Joy David C.,Griffin Brendan J.,Notte John,Stern Lewis,McVey Shawn,Ward Bill,Fenner Clarke
Cited by
2 articles.
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1. Review of current progress in nanometrology with the helium ion microscope;Measurement Science and Technology;2010-12-21
2. Gas Field Ionization Sources;Handbook of Charged Particle Optics, Second Edition;2008-10-24