Efficient full-chip SRAF placement using machine learning for best accuracy and improved consistency-Reference-Cited by-同舟云学术

Efficient full-chip SRAF placement using machine learning for best accuracy and improved consistency

Published:2018-03-20 Issue: Volume: Page:
ISSN:
Container-title:Optical Microlithography XXXI
language:
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Author:

Wang Shibing,Baron Stanislas,Kachwala Nishrin,Kallingal Chidam,Su Jing,Zhang Quan,Shu Vincent,Gao Jin-Wei,Ser Jung-Hoon,Li Zero,Elsaid Ahmad,Chen Been-Der,Fong Weichun,Sun Dezheng,Howell Rafael,Hsu Stephen D.,Luo Larry,Zou Yi,Zhang Gary,Lu Yen-Wen,Cao Yu

Publisher

SPIE

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5. Machine learning assisted SRAF placement for full chip;Wang,2017

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