Author:
Wuu Jen-Yi,Pikus Fedor G.,Torres Andres,Marek-Sadowska Malgorzata
Cited by
10 articles.
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1. An algorithm for rule-based layout pattern matching;Proceedings of the 39th International Conference on Computer-Aided Design;2020-11-02
2. Lithography Hotspot Detection with FFT-based Feature Extraction and Imbalanced Learning Rate;ACM Transactions on Design Automation of Electronic Systems;2020-03-17
3. CAPP: context analyzer and printability predictor;Design-Process-Technology Co-optimization for Manufacturability XIII;2019-03-20
4. Lithography hotspot candidate detection using coherence map;Design-Process-Technology Co-optimization for Manufacturability XIII;2019-03-20
5. Pattern Similarity Metrics for Layout Pattern Classification and Their Validity Analysis by Lithographic Responses;2018 IEEE Computer Society Annual Symposium on VLSI (ISVLSI);2018-07