Hard x-ray nano-focusing at 40nm level using K-B mirror optics for nanoscopy/spectroscopy-Reference-Cited by-同舟云学术

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Hard x-ray nano-focusing at 40nm level using K-B mirror optics for nanoscopy/spectroscopy

Published:2005-08-18 Issue: Volume: Page:
ISSN:0277-786X
Container-title:Laser-Generated, Synchrotron, and Other Laboratory X-Ray and EUV Sources, Optics, and Applications II
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Author:

Matsuyama Satoshi,Mimura Hidekazu,Yumoto Hirokatsu,Hara Hideyuki,Yamamura Kazuya,Sano Yasuhisa,Endo Katsuyoshi,Mori Yuzo,Nishino Yoshinori,Tamasaku Kenji,Yabashi Makina,Ishikawa Tetsuya,Yamauchi Kazuto

Publisher

SPIE

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Unraveling Catalytic Reaction Mechanism by In Situ Near Ambient Pressure X-ray Photoelectron Spectroscopy;The Journal of Physical Chemistry Letters;2022-08-29

2. Sub-micrometre depth-gradient measurements of phase, strain and texture in polycrystalline thin films: a nano-pencil beam diffraction approach;Journal of Applied Crystallography;2014-02-22

3. At-wavelength figure metrology of total reflection mirrors in hard x-ray region;SPIE Proceedings;2006-08-31

4. At-wavelength figure metrology of hard x-ray focusing mirrors;Review of Scientific Instruments;2006-06

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