Robust method for interest region description based on local intensity binary pattern-Reference-Cited by-同舟云学术

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Robust method for interest region description based on local intensity binary pattern

Published:2017-08-28 Issue:04 Volume:26 Page:1
ISSN:1017-9909
Container-title:Journal of Electronic Imaging
language:
Short-container-title:J. Electron. Imaging

Author:

Yang Yi¹,Duan Fajie¹,Jiang Jiajia¹,Ma Ling¹,Zheng Hao¹

Affiliation:

1. Tianjin University, State Key Laboratory of Precision Measurement Technology and Instruments, Tianji

Publisher

SPIE-Intl Soc Optical Eng

Subject

Electrical and Electronic Engineering,Computer Science Applications,Atomic and Molecular Physics, and Optics

Reference42 articles.

1. Distinctive Image Features from Scale-Invariant Keypoints

2. Matching Widely Separated Views Based on Affine Invariant Regions

3. A sparse texture representation using affine-invariant regions

4. Reconstructing Rome

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