Qualification of silicon pore optics-Reference-Cited by-同舟云学术

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Qualification of silicon pore optics

Published:2014-07-24 Issue: Volume: Page:
ISSN:0277-786X
Container-title:SPIE Proceedings
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Author:

Wille Eric,Bavdaz Marcos,Fransen Sebastiaan,Collon Maximilien,Ackermann Marcelo,Guenther Ramses,Chatbi Abdelhakim,Vacanti Giuseppe,Vervest Mark,van Baren Coen,Haneveld Jeroen,Riekerink Mark Olde,Koelewijn Arenda,Kampf Dirk,Zuknik Karl-Heinz,Reutlinger Arnd

Publisher

SPIE

Reference6 articles.

1. M. Bavdaz et al., Proc. SPIE 8861, 88610L (2013).

2. M. Olde Riekerink et al., Proc. SPIE 7437, 74370U (2009).

3. M. Collon et al., Proc. SPIE 8147, 81470D (2011).

4. N. Rando et al., Proc. SPIE 8443, 844328 (2012).

5. M. Ackermann et al., Proc. SPIE 7732, 77322T (2010).

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Environmental testing of silicon pore optics for Athena;Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX;2019-10-08

3. Optics developments for ATHENA;Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX;2019-09-09

4. Silicon pore optics manufacturing plan and schedule for ATHENA;Space Telescopes and Instrumentation 2018: Ultraviolet to Gamma Ray;2018-07-06

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