Author:
Kim Yongkyung,Seong Kihun,Yoon Jonghyuk,Lee Donggi,Moon Seungchan,Jang Sung Kyu,Kim Hyun-Mi,Kim Seul-Gi,Ahn Jinho,Kim Hyeongkeun
Reference11 articles.
1. EUV Lithography, Second Edition
2. The Center for X-Ray Optics (CXRO), “Index of refraction,” http://henke.lbl.gov/optical_constants/getdb2.html