Degradation mechanism of SESAMs under intense ultrashort pulses in modelocked VECSELs-Reference-Cited by-同舟云学术

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Degradation mechanism of SESAMs under intense ultrashort pulses in modelocked VECSELs

Published:2018-02-15 Issue: Volume: Page:
ISSN:
Container-title:Vertical External Cavity Surface Emitting Lasers (VECSELs) VIII
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Author:

Addamane Sadhvikas,Balakrishnan Ganesh,Laurain Alexandre,Chan Hsiu-Ting,Moloney Jerome V.,Shima Darryl

Publisher

SPIE

Reference42 articles.

1. Recent developments in compact ultrafast lasers

2. Semiconductor Disk Lasers

3. Femtochemistry: Atomic-Scale Dynamics of the Chemical Bond

4. Shah, J., [Ultrafast spectroscopy of semiconductors and semiconductor nanostructures], Vol. 115. Springer Science & Business Media (2013).

5. Subpicosecond electrooptic sampling: Principles and applications

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Hybrid SESAMs for high-repetition rate mode-locked VECSELs;Vertical External Cavity Surface Emitting Lasers (VECSELs) XII;2023-03-14

2. Colliding Pulse Mode Locking and Nonequilibrium Carrier Dynamics within Vertical External-Cavity Surface-Emitting Lasers;Physical Review Applied;2022-08-02

3. High peak power GaSb-based VECSELs;Vertical External Cavity Surface Emitting Lasers (VECSELs) XI;2022-03-04

4. Ultra-Short Pulse Lasers for Microfabrication: A Review;IEEE Journal of Selected Topics in Quantum Electronics;2021-11

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