Surface topography measurement of plasma-facing materials by dual-wavelength phase-shifting speckle interferometry technique
Author:
Affiliation:
1. Dalian University of Technology, Key Laboratory of Materials Modification by Laser, Ion and Electron
Publisher
SPIE-Intl Soc Optical Eng
Subject
General Engineering,Atomic and Molecular Physics, and Optics
Reference28 articles.
1. A novel contact/non-contact hybrid measurement system for surface topography characterization
2. Direct and Non-Direct Measurement Techniques for Analysis of Skin Surface Topography
3. Optical techniques for on-line measurement of surface topography
4. Speckle Interferometry
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