Author:
Park Chul-Hong,Kim Yoo-Hyon,Park Ji-Soong,Kim Kwan-Do,Yoo Moon-Hyun,Kong Jeong-Taek
Cited by
10 articles.
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1. Improved Tangent Space-Based Distance Metric for Lithographic Hotspot Classification;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2017-09
2. Fast Dual-Graph-Based Hotspot Filtering;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2008-09
3. Efficient range pattern matching algorithm for process-hotspot detection;IET Circuits, Devices & Systems;2008
4. Detailed Placement for Enhanced Control of Resist and Etch CDs;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2007-12
5. Fast dual graph-based hotspot detection;SPIE Proceedings;2006-10-06