1. Radiated EMI evolution of power SiC MOSFET in a boost converter after short-circuit aging tests;Douzi;Microelectronics Reliability,2019
2. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
3. Artificial intelligence SF6 circuit breaker health assessment;Zarkovic;Electric power systems research,2019
4. IEEE Transactions on Power Electronics
5. Improving the reliability of SRAM-based PUFs under varying operation conditions and aging degradation;Saraza-Canflanca;Microelectronics Reliability,2021