Reliability study on high power 638nm broad stripe LD with a window-mirror structure-Reference-Cited by-同舟云学术

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Reliability study on high power 638nm broad stripe LD with a window-mirror structure

Published:2014-03-07 Issue: Volume: Page:
ISSN:0277-786X
Container-title:SPIE Proceedings
language:
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Author:

Yagi Tetsuya,Mitsuyama Hiroshi,Nishida Takehiro,Kadoiwa Kaoru,Kuramoto Kyosuke

Publisher

SPIE

Reference36 articles.

1. Rezadeisupurei (Laser Display);Kuroda,2010

2. Smart Laser Display;Yamamoto,2013

3. Technical Roadmap of Laser Display- Direction of Lasers as Light Sources for Display Applications -

4. High Power Red Laser Diodes: Past, Present, and Future;Yagi,2013

5. Scanning laser beam displays;Niesten,2008

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Determination of the Limiting Characteristics of a Laser-Diode Bar by Analyzing Emission in the Near Field;Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques;2022-06

2. 638nm Wide Stripe Semiconductor Laser with 2W Output Power;The International Photonics and Optoelectronics Meeting (POEM);2018

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