Reliability study on high power 638nm broad stripe LD with a window-mirror structure

Author:

Yagi Tetsuya,Mitsuyama Hiroshi,Nishida Takehiro,Kadoiwa Kaoru,Kuramoto Kyosuke

Publisher

SPIE

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1. Determination of the Limiting Characteristics of a Laser-Diode Bar by Analyzing Emission in the Near Field;Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques;2022-06

2. 638nm Wide Stripe Semiconductor Laser with 2W Output Power;The International Photonics and Optoelectronics Meeting (POEM);2018

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