Simplified charge transfer inefficiency correction in CCDs by trap-pumping
Author:
Affiliation:
1. The Open Univ. (United Kingdom)
Publisher
SPIE
Reference22 articles.
1. Review of displacement damage effects in silicon devices
2. Assessment of space proton radiation-induced charge transfer inefficiency in the CCD204 for the Euclid space observatory
3. Modelling radiation damage to ESA’s Gaia satellite CCDs;Seabroke,2008
4. Assessment of the performance and radiation damage effects under cryogenic temperatures of a P-channel CCD204s;Murray,2014
5. Postirradiation behavior of p-channel charge-coupled devices irradiated at 153 K
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Proton-induced traps in electron multiplying charge-coupled devices;Journal of Astronomical Telescopes, Instruments, and Systems;2021-03-09
2. On-ground and in-orbit characterisation plan for the PLATO CCD normal cameras;Journal of Instrumentation;2017-11-30
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