Gentle method for removing metal and restoring function after scanning electron microscopy-Reference-Cited by-同舟云学术

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Gentle method for removing metal and restoring function after scanning electron microscopy

Published:2021-05-06 Issue:02 Volume:20 Page:
ISSN:2708-8340
Container-title:Journal of Micro/Nanopatterning, Materials, and Metrology
language:
Short-container-title:J. Micro/Nanopattern. Mats. Metro.

Author:

Sharma Rashi¹,Digaum Jennefir L.²,West Hannah²,Schwarz Casey M.³,Kuebler Stephen M.¹

Affiliation:

1. University of Central Florida, Department of Chemistry, Orlando, Florida

2. University of Central Florida, CREOL, The College of Optics and Photonics, Orlando, Florida

3. Ursinus College, Department of Physics and Astronomy, Collegeville, Pennsylvania

Funder

National Science Foundation

Publisher

SPIE-Intl Soc Optical Eng

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. The use of scanning electron microscopy and fixation methods to evaluate the interaction of blood with the surfaces of medical devices;Scientific Reports;2024-02-26

2. Application of sensor-based image optical processing in the vision system of tea ware glaze design;Optical and Quantum Electronics;2023-12-27

3. Conductive cross-section preparation of non-conductive painting micro-samples for SEM analysis;Scientific Reports;2022-11-16

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