Theoretical study for aerial image intensity in resist in high numerical aperture projection optics and experimental verification with one-dimensional patterns
Author:
Affiliation:
1. Tokyo Polytechnic University, 1583 Iiyama, Atsugi-shi, Kanagawa 243-0297, Japan
2. Topcon Corporation, 75-1, Hasunuma-cho, Itabashi-ku, Tokyo 174-8580, Japan
3. Nikon Corporation, Naka-cho, Oomiya-ku, Saitama 330-0845, Japan
Publisher
SPIE-Intl Soc Optical Eng
Subject
Electrical and Electronic Engineering,Mechanical Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
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