Simulation and detection of electron back-scattering in ion barrier films of micro-channel plate-Reference-Cited by-同舟云学术

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Simulation and detection of electron back-scattering in ion barrier films of micro-channel plate

Published:2015-03-04 Issue: Volume: Page:
ISSN:0277-786X
Container-title:Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part I
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Author:

Fu Shencheng,Li Ye,Shi Feng,Miao Zhuang,Cheng Hongchang,Duanmu Qingduo

Publisher

SPIE

Reference9 articles.

1. Electricity Vacuum Imaging Device and Theoretical Analysis;Yisong,1989

2. An Analysis of Electron Scattering in Thin Dielectric Films Used as Ion Barriers in Generation III Image Tubes;Timothy,2003

3. Recent advancements in the field of image intensification: the generation 3 wafer tube

4. High reliability GaAs image intensifier with unfilmed microchannel plate;Bender,1999

5. Backscattering of low energy electrons from carbon films deposited on aluminum: A Monte Carlo simulation

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