Investigation of the arsenic sulphide films for relief-phase holograms

Author:

Yusupov Igor Y.1,Mikhailov Mikhail D.2,Herke Rudolf2,Goray Leonid I.2,Mamedov S. B.2,Yakovuk O. A.2

Affiliation:

1. Holograte, JSC (Russia)

2. Vavilov State Optical Institute (Russia)

Publisher

SPIE

Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

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3. X-ray echelles: account of groove profile deformations for diffraction efficiency in electromagnetic calculus;2023 Days on Diffraction (DD);2023-06-05

4. Diffraction Grating Groove Metrology Using AFM and STM;Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization;2022-01-07

5. Diffraction gratings for short-wave radiation: Modern requirements and achievements;Bulletin of the Russian Academy of Sciences: Physics;2013-01

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