Comparative study on submillimeter flaws in stitched T-joint carbon fiber reinforced polymer by infrared thermography, microcomputed tomography, ultrasonic c-scan and microscopic inspection

Author:

Zhang Hai1,Hassler Ulf2,Genest Marc3,Fernandes Henrique1,Robitaille Francois4,Ibarra-Castanedo Clemente1,Joncas Simon5,Maldague Xavier1

Affiliation:

1. Laval University, Department of Electrical and Computer Engineering, Computer Vision and Systems Laboratory, 1065 Avenue de la Medecine, Quebec G1V 0A6, Canada

2. Fraunhofer IIS, Fraunhofer Development Center X-ray Technologies (EZRT), Department of Application Specific Methods and Systems (AMS), Flugplatzstrasse 75, Fuerth 90768, Germany

3. National Research Council Canada, Aerospace Portfolio, Structures, Materials and Manufacturing, 1200 Montreal Road, Ottawa K1A 0R6, Canada

4. University of Ottawa, Department of Mechanical Engineering, 161 Louis Pasteur, Ottawa K1N 6N5, Canada

5. Ecole de Technologie Superieure, Department of Automated Manufacturing Engineering, 1100 rue Notre-Dame Ouest, Montreal H3C 1K3, Canada

Publisher

SPIE-Intl Soc Optical Eng

Subject

General Engineering,Atomic and Molecular Physics, and Optics

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