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Monte Carlo simulation of three-dimensional measurements of translucent objects

  • Published:2015-08-21 Issue:8 Volume:54 Page:084111
  • ISSN:0091-3286
  • Container-title:Optical Engineering
  • language:en
  • Short-container-title:Opt. Eng

Author:

Lutzke Peter1,Heist Stefan1,Kühmstedt Peter1,Kowarschik Richard2,Notni Gunther3

Affiliation:

1. Fraunhofer Institute for Applied Optics and Precision Engineering, Albert-Einstein-Straße 7, Jena 07745, Germany

2. Friedrich Schiller University, Jena Institute of Applied Optics, Fröbelstieg 1, Jena 07743, Germany

3. Technical University Ilmenau, Group for Quality Assurance and Industrial Image Processing, Gustav-Kirchhoff-Platz 2, Ilmenau 98693, Germany

Publisher

SPIE-Intl Soc Optical Eng

Subject

General Engineering,Atomic and Molecular Physics, and Optics

Reference12 articles.

1. Polarization and phase-shifting for 3D scanning of translucent objects;Chen,2007

2. Modulated phase-shifting for 3D scanning;Chen,2008

3. Fast separation of direct and global components of a scene using high frequency illumination

4. Phasenschiebe-Verfahren in der interferometrischen Messtechnik: Ein Vergleich;Kreis,1994

5. Surface reflection: physical and geometrical perspectives
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