Author:
Wan Min,Yuan Hui,Čibiraitė Dovilė,Cassidy Derek J.,Lisauskas Alvydas,Healy John J.,Roskos Hartmut G.,Krozer Viktor,Sheridan John T.
Cited by
1 articles.
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1. Characterization of silicon in the terahertz;Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XIII;2020-03-02