Optical constants of e-beam evaporated titanium dioxide thin films in the 25.5- to 612-eV energy region-Reference-Cited by-同舟云学术

Optical constants of e-beam evaporated titanium dioxide thin films in the 25.5- to 612-eV energy region

Published:2016-09-14 Issue:9 Volume:55 Page:095102
ISSN:0091-3286
Container-title:Optical Engineering
language:en
Short-container-title:Opt. Eng

Author:

Comisso Antonela¹,Nardello Marco¹,Giglia Angelo²,Nicolosi Piergiorgio¹

Affiliation:

1. University of Padova, Department of Information Engineering, via Gradenigo 6B, Padova 35131, ItalybConsiglio Nazionale delle Ricerche, Institute for Photonics and Nanotechnologies Laboratory for Ultraviolet and X-Ray Optical Research, via Trasea 7, Padova 35131, Italy

2. Istituto Officina Materiali-CNR, s.s. 14 Km 163.5 in Area Science Park, Basovizza, Trieste 34149, Italy

Publisher

SPIE-Intl Soc Optical Eng

Subject

General Engineering,Atomic and Molecular Physics, and Optics

Reference30 articles.

1. X-Ray Interactions: Photoabsorption, Scattering, Transmission, and Reflection at E = 50-30,000 eV, Z = 1-92

2. Optical constants of magnetron-sputtered boron carbide thin films from photoabsorption data in the range 30 to 770 eV

3. Optical properties of zirconium carbide in 60–200 Å wavelength region using x-ray reflectivity technique

4. Properties of ultrathin films appropriate for optics capping layers exposed to high energy photon irradiation

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