Development of depth-graded W/Si multilayer mirrors for x-ray focusing telescope application-Reference-Cited by-同舟云学术

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Development of depth-graded W/Si multilayer mirrors for x-ray focusing telescope application

Published:2017-05-31 Issue: Volume: Page:
ISSN:0277-786X
Container-title:SPIE Proceedings
language:
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Author:

Qi Runze¹,Huang Qiushi¹,Yang Yang¹,Zhang Zhong¹,Wang Zhanshan¹

Affiliation:

1. Tongji Univ. (China)

Publisher

SPIE

Reference22 articles.

1. The x-ray timing and polarization satellite - 1, 2, 3: uncovering the mysteries of black holes and extreme physics in the universe;Dong,2014

2. Growth, structure, and performance of depth-graded W/Si multilayers for hard x-ray optics

3. DC magnetron sputtered tungsten: W film properties and electrical properties of W/Si Schottky diodes

4. Stress, microstructure, and stability of Mo/Si, W/Si, and Mo/C multilayer films

5. Characteristics and thermal behavior of W/Si multilayers with well‐defined interfaces

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