New x-ray parallel beam facility XPBF 2.0 for the characterization of silicon pore optics
Author:
Affiliation:
1. Physikalisch-Technische Bundesanstalt (Germany)
2. cosine Research B.V. (Netherlands)
3. European Space Agency, ESTEC (Netherlands)
Publisher
SPIE
Reference7 articles.
1. The Athena Optics;Bavdaz,2015
2. X-ray pencil beam facility for optics characterization;Krumrey,2010
3. X-ray pencil beam characterization of silicon pore optics;Vacanti,2013
4. Characterization and calibration of 2nd generation slope measuring profiler
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