Evaluation of 1/f noise in prospective IR imaging thin films-Reference-Cited by-同舟云学术

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Evaluation of 1/f noise in prospective IR imaging thin films

Published:2014-06-24 Issue: Volume: Page:
ISSN:0277-786X
Container-title:SPIE Proceedings
language:
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Author:

Basantani Hitesh A.,Saint John David B.,Podraza Nikolas J.,Jackson Thomas N.,Horn Mark W.

Publisher

SPIE

Reference25 articles.

1. Uncooled thermal imaging with monolithic silicon focal arrays;Wood,1993

2. Monolithic silicon microbolometer arrays;Wood,1997

3. Advances in small-pixel, large-format α-Si bolometer arrays;Schimert,2009

4. Performance improvement in amorphous silicon based uncooled microbolometers through pixel design and materials development;Ajmera,2011

5. Enhanced electrical and noise properties of nanocomposite vanadium oxide thin films by reactive pulsed-dc magnetron sputtering

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1. Conductance fluctuations in hydrogenated amorphous germanium;Journal of Applied Physics;2021-09-14

2. Mean Free Path of Photoelectronic Excitations in Hydrogenated Amorphous Silicon and Silicon Germanium Alloy Semiconductors;physica status solidi (b);2021-07-03

3. Wide-temperature (up to 100 °C) operation of thermostable vanadium oxide based microbolometers with Ti/MgF2 infrared absorbing layer for long wavelength infrared (LWIR) detection;Applied Surface Science;2021-05

4. Dual band sensitivity enhancements of a VO_x microbolometer array using a patterned gold black absorber;Applied Optics;2016-03-10

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