New developments in the determination of the complex refractive index of arbitrary absorptance thin films from envelope profiles of a single transmittance curve-Reference-Cited by-同舟云学术

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New developments in the determination of the complex refractive index of arbitrary absorptance thin films from envelope profiles of a single transmittance curve

Published:2018-02-22 Issue: Volume: Page:
ISSN:
Container-title:Optical Components and Materials XV
language:
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Author:

Desforges Jean,Gauvin Serge,Gaudet Eric

Publisher

SPIE

Reference11 articles.

1. OLED Fundamentals

2. Organic Solid-State Lasers

3. Thin-film optical filters;Macleod,2010

4. Piegari, A. and Flory, F., [Optical thin films and coatings: From materials to applications], Woodhead Publishing, Elsevier, Cambridge, (2013).

5. Optical Coatings

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Perfecting the dispersion model free characterization of a thin film on a substrate specimen from its normal incidence interference transmittance spectrum;Thin Solid Films;2020-07

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