A portable device for calibration of autocollimators with nanoradian precision

Author:

Yandayan Tanfer

Publisher

SPIE

Reference29 articles.

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5. Sub-microradian surface slope metrology with the ALS Developmental Long Trace Profiler

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. High precision (Advanced) angle metrology: pushing the limits for nanoradian uncertainty demands;Journal of Physics: Conference Series;2018-08

2. Recent developments in nanoradian-angle metrology;Advances in Metrology for X-Ray and EUV Optics VII;2017-09-07

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