Silicon oxides and silicon nitrides: structure, properties and applications in memristors-Reference-Cited by-同舟云学术

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Silicon oxides and silicon nitrides: structure, properties and applications in memristors

Published:2019-03-15 Issue: Volume: Page:
ISSN:
Container-title:International Conference on Micro- and Nano-Electronics 2018
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Author:

Volodin Vladimir A.,Kamaev Gennadiy N.,Kruchinin Vladimir N.,Gritsenko Vladimir A.

Publisher

SPIE

Reference16 articles.

1. Resistive switching phenomena: A review of statistical physics approaches;Jae Sung;Appl. Phys. Rev.,2015

2. A Novel Read Scheme for Large Size One-Resistor Resistive Random Access Memory Array;Mohammed;Scientific Reports,2017

3. Investigation of resistance switching in SiOx RRAM cells using a 3D multi-scale kinetic Monte Carlo simulator;Toufik;J. Phys.: Condens. Matter,2018

4. Forming-free resistive switching in solution-processed silicon nanocrystal thin film;Takeshi;J. Appl. Phys.,2018

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