Fast and reliable approach to calculate energy levels in semiconductor nanostructures-Reference-Cited by-同舟云学术

Fast and reliable approach to calculate energy levels in semiconductor nanostructures

Published:2015-03-06 Issue:1 Volume:9 Page:093080
ISSN:1934-2608
Container-title:Journal of Nanophotonics
language:en
Short-container-title:J. Nanophoton

Author:

Thierry François¹,Le Rouzo Judikaël¹,Flory François²,Berginc Gérard³,Escoubas Ludovic¹

Affiliation:

1. Aix-Marseille Université, Institut Matériaux Microélectronique Nanosciences de Provence-IM2NP, CNRS-UMR 7334, Domaine Universitaire de Saint-Jérôme, Service 231, 13397 Marseille, France

2. Aix-Marseille Université, Institut Matériaux Microélectronique Nanosciences de Provence-IM2NP, CNRS-UMR 7334, Domaine Universitaire de Saint-Jérôme, Service 231, 13397 Marseille, FrancebEcole Centrale Marseille, 38 rue Joliot Curie, 13451 Marseille, Franc

3. THALES Optronique SA, 2 Avenue Gay Lussac, 78990 Elancourt, France

Publisher

SPIE-Intl Soc Optical Eng

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

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