Laser speckle reduction techniques for mid-infrared microscopy and stand-off spectroscopy-Reference-Cited by-同舟云学术

Laser speckle reduction techniques for mid-infrared microscopy and stand-off spectroscopy

Published:2017-05-05 Issue: Volume: Page:
ISSN:0277-786X
Container-title:SPIE Proceedings
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Author:

Furstenberg Robert¹,Kendziora Christopher A.¹,Breshike Christopher J.¹,Nguyen Viet¹,McGill R. Andrew¹

Affiliation:

1. U.S. Naval Research Lab. (United States)

Publisher

SPIE

Reference16 articles.

1. Goodman, J.W., [Speckle Phenomena in Optics], Roberts & Company, Englewood Colorado, (2007).

2. Furstenberg, R., Kendziora, C., Papantonakis, M., Nguyen, V. and McGill, R.A., “Advances in photo-thermal infrared imaging microspectroscopy,” Proc. SPIE 8729, 87290H (2013).

3. Furstenberg, R., Kendziora, C.A., Papantonakis, M.R., Nguyen, V. and McGill, R.A., “Chemical Imaging using Infrared Photo-thermal Microspectroscopy,” Proc. SPIE 8374, 837411 (2012).

4. Furstenberg, R., Kendziora, C.A., Papantonakis, M.R., Nguyen, V. and McGill, R.A., “Photo-Thermal Spectroscopic Imaging of MEMS Structures with Sub-Micron Spatial Resolution,” Mater. Res. Soc. Symp. Proc. 1415, 35–40 (2012).

5. Infrared photothermal imaging spectroscopy for detection of trace explosives on surfaces

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