Developing an accelerated life test method for LED source and failure analysis

Author:

Gong Chen,Xu Haiping,Liang Jinhua,Yuan Zengquan,Chen Xi,Li Haoyan

Publisher

SPIE

Reference16 articles.

1. Accelerated degradation test investigation for life-time performance analysis of led luminaires;Padmasali;IEEE T COMP PACK MAN,2020

2. Accelerated thermo-mechanical test method for LED modules;J., M,2016

3. Design and prototyping of highly-collimated long-distance optical systems with an LED light source

4. Light emitting diodes reliability review

5. A Lifetime Prediction Method for LEDs Considering Real Mission Profiles

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