Characterization of the polishing induced contamination of fused silica optics-Reference-Cited by-同舟云学术

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Characterization of the polishing induced contamination of fused silica optics

Published:2016-12-06 Issue: Volume: Page:
ISSN:0277-786X
Container-title:SPIE Proceedings
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Author:

Pfiffer Mathilde¹,Longuet Jean-Louis¹,Labrugère Christine²,Fargin Evelyne³,Bousquet Bruno⁴,Dussauze Marc⁵,Lambert Sébastien¹,Cormont Philippe¹,Néauport Jérôme¹

Affiliation:

1. Commissariat à l'Énergie Atomique (France)

2. Plateforme Aquitaine de Caractérisations des Matériaux (France)

3. Institut de Chimie de la Matière Condensée de Bordeaux (France)

4. Ctr. Lasers Intenses et Applications, Univ. de Bordeaux, CNRS (France)

5. Institut des Sciences Moléculaires (France)

Publisher

SPIE

Reference15 articles.

1. [Aggregation and flow of solids];Beilby,1921

2. Analysis of surface layers;Bach,1983

3. Near surface modification of silica structure induced by chemical/mechanical polishing

4. Depth profiling of polishing-induced contamination on fused silica surfaces;Kozlowski,1998

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Evolution law of comet-shaped defects in magnetorheological finishing;Applied Optics;2022-01-13

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