Author:
Burwitz Vadim,Hartner Gisela,Müller Thomas,Rukdee Surangkhana,Schmidt Thomas,Langmeier Andreas,Bavdaz Marcos,Ferreira Ivo,Collon Maximilien J.,Vacanti Giuseppe,Barrière Nicolas M.,Salmaso Bianca,Moretti Alberto,Spiga Daniele,Sironi Giorgia
Reference15 articles.
1. In focus measurements of IXO type optics using the new PANTER x-ray test facility extension
2. X-ray Testing at PANTER of Optics for the ATHENA and Arcus Missions;Burwitz;Proc. of SPIE,2018
3. X-ray testing ATHENA optics at PANTER;Burwitz;Proc. SPIE,2022
4. ATHENA optics technology development
5. NewATHENA optics technology;Bavdaz;these Proc. SPIE,2023