Analysis method of microstructure surface topography based on wavelet filter

Author:

Zhang Shu1,Shi Yushu1,Gao Sitian1,Pi Lei1,Li Qi1,Li Wei1,Zhu Zhendong1,Li Shi1,Huang Lu1,Guo Xin2

Affiliation:

1. National Institute of Metrology (China)

2. China Jiliang Univ. (China)

Publisher

SPIE

Reference16 articles.

1. Modeling and controlling of surface micro-topography feature in micro-ball-end milling;Peng,2013

2. D.Malacara, [Optical Shop Testing: Third Edition] China Machine Press, Beijing, 435–493(2012)

3. Hu XT, Fu X, Liu QG, [Micro-nano Detection Technology] Tianjin University Press, Tianjin, 15–48(2009)

4. Wang BX, Chen FF, Dong Y, [Metrology for Micro- and Nanotechnology] Tsinghua University Press, Beijing, 1–8(2006)

5. Limits of surface measurement by stylus instruments;Stedman,1989

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