A new high-voltage diode structure with backside double injection holes (BDIH)
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Publisher
SPIE
Reference13 articles.
1. On the formation of stationary destructive cathode-side filaments in p+-n−-n+ diodes
2. On the destruction limit of Si power diodes during reverse recovery with dynamic avalanche
3. The $\hbox{nn}^{+}$-Junction as the Key to Improved Ruggedness and Soft Recovery of Power Diodes
4. Cathode-Side Current Filaments in High-Voltage Power Diodes Beyond the SOA Limit
5. Filament-induced thermomigration of an aluminum drop at the cathode-side of high-voltage power diodes
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