A pixelated x-ray detector for diffraction imaging at next-generation high-rate FEL sources-Reference-Cited by-同舟云学术

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A pixelated x-ray detector for diffraction imaging at next-generation high-rate FEL sources

Published:2017-08-24 Issue: Volume: Page:
ISSN:
Container-title:Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIX
language:
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Author:

Comotti Daniele,Forti Francesco,Morsani Fabio,Paladino Antonio,Paoloni Eugenio,Rizzo Giuliana,Dalla Betta Gian-Franco,Verzellesi Giovanni,Xu Hesong,Lodola Luca,Fabris Lorenzo,Grassi Marco,Ratti Lodovico,Malcovati Piero,Manghisoni Massimo,Re Valerio,Traversi Gianluca,Vacchi Carla,Batignani Giovanni,Bettarini Stefano,Mendicino Roberto,Pancheri Lucio,Casarosa G.,Benkechkache M. A.

Publisher

SPIE

Reference10 articles.

1. Single-shot three-dimensional structure determination of nanocrystals with femtosecond X-ray free-electron laser pulses

2. Molecular Imaging Using X-Ray Free-Electron Lasers

3. AMO science at the FLASH and European XFEL free-electron laser facilities

4. Investigation of X-ray induced radiation damage at the Si-SiO2interface of silicon sensors for the European XFEL

5. Design and First Characterization of Active and Slim-Edge Planar Detectors for FEL Applications

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Optimizing and characterizing the Timepix2 hybrid pixel detector: enhancing performance and precision for scientific and industrial applications;Journal of Instrumentation;2024-01-01

2. Challenges of x-ray spectroscopy in investigations of matter under extreme conditions;Matter and Radiation at Extremes;2019-03

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