The distorted helix: thin film extraction from scanning white light interferometry
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SPIE
Cited by 17 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Accurate Measurements of Droplet Volume With Coherence Scanning Interferometry;IEEE Transactions on Instrumentation and Measurement;2023
2. Measurement of Film Structure Using Time-Frequency-Domain Fitting and White-Light Scanning Interferometry;Machines;2021-12-07
3. Single sequence phase shifting spectrally resolved interferometry for an in-line thin film thickness measurement using spectral reflectance and phase;Applied Optics;2021-10-15
4. Single-shot spectrally resolved interferometry for the simultaneous measurement of the thickness and surface profile of multilayer films;Optics Express;2021-07-26
5. White Light Interferometry;Handbook of Advanced Nondestructive Evaluation;2019
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