Empirical dark current modeling for complementary metal oxide semiconductor active pixel sensor-Reference-Cited by-同舟云学术

Empirical dark current modeling for complementary metal oxide semiconductor active pixel sensor

Published:2002-06-01 Issue:6 Volume:41 Page:1216
ISSN:0091-3286
Container-title:Optical Engineering
language:en
Short-container-title:Opt. Eng

Author:

Shcherback Igor

Publisher

SPIE-Intl Soc Optical Eng

Subject

General Engineering,Atomic and Molecular Physics, and Optics

Reference11 articles.

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2. CMOS active pixel image sensors for highly integrated imaging systems

3. O. Yadid-Pecht, B. Mansoorian, E. Fossum, and B. Pain, “Optimization of active pixel sensor noise and responsivity for scientific applications,” inProc. SPIE/IS&T Symp. on Electronic Imaging: Science and Technology,San Jose, CA (1997).

4. Total dose effects on CMOS active pixel sensors

5. Analysis of temporal noise in CMOS photodiode active pixel sensor

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