Author:
Bencher Chris,Yi He,Zhou Jessica,Cai Manping,Smith Jeffrey,Miao Liyan,Montal Ofir,Blitshtein Shiran,Lavi Alon,Dotan Kfir,Dai Huixiong,Cheng Joy Y.,Sanders Daniel P.,Tjio Melia,Holmes Steven
Cited by
50 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Resistive Random Access Memory (RRAM) Technology: From Material, Device, Selector, 3D Integration to Bottom-Up Fabrication;Resistive Switching: Oxide Materials, Mechanisms, Devices and Operations;2021-10-16
2. Progress in nanoscale dry processes for fabrication of high-aspect-ratio features: How can we control critical dimension uniformity at the bottom?;Japanese Journal of Applied Physics;2018-05-25
3. Optimizing self-consistent field theory block copolymer models with X-ray metrology;Molecular Systems Design & Engineering;2018
4. Effect of chemoepitaxial guiding underlayer design on the pattern quality and shape of aligned lamellae for fabrication of line-space patterns;Journal of Micro/Nanolithography, MEMS, and MOEMS;2017-10-27
5. Resistive random access memory (RRAM) technology: From material, device, selector, 3D integration to bottom-up fabrication;Journal of Electroceramics;2017-06-24