Tackling the x-ray cargo inspection challenge using machine learning-Reference-Cited by-同舟云学术

Tackling the x-ray cargo inspection challenge using machine learning

Published:2016-05-12 Issue: Volume: Page:
ISSN:0277-786X
Container-title:SPIE Proceedings
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Author:

Jaccard Nicolas,Rogers Thomas W.,Morton Edward J.,Griffin Lewis D.

Publisher

SPIE

Reference45 articles.

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