Characterizing surface roughness of thin films by polarized light scattering-Reference-Cited by-同舟云学术

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Characterizing surface roughness of thin films by polarized light scattering

Published:2003-11-07 Issue: Volume: Page:
ISSN:0277-786X
Container-title:SPIE Proceedings
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Author:

Germer Thomas A.,Fasolka Michael J.

Publisher

SPIE

Cited by 12 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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