Enhancing resolution and contrast in second-harmonic generation microscopy using an advanced maximum likelihood estimation restoration method-Reference-Cited by-同舟云学术

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Enhancing resolution and contrast in second-harmonic generation microscopy using an advanced maximum likelihood estimation restoration method

Published:2017-02-21 Issue: Volume: Page:
ISSN:0277-786X
Container-title:SPIE Proceedings
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Author:

Sivaguru Mayandi¹,Kabir Mohammad M.¹,Gartia Manas Ranjan²,Biggs David S. C.³,Sivaguru Barghav S.¹,Sivaguru Vignesh A.¹,Berent Zachary T.¹,Wagoner Johnson Amy J.¹,Fried Glenn A.¹,Liu Gang Logan¹,Sadayappan Sakthivel⁴,Toussaint Kimani C.¹

Affiliation:

1. Univ. of Illinois at Urbana-Champaign (United States)

2. Louisiana State Univ. (United States)

3. KB Imaging Solutions LLC (United States)

4. Univ. of Cincinnati College of Medicine (United States)

Publisher

SPIE

Reference28 articles.

1. Fundamental Limits in Confocal Microscopy;Pawley,1989

2. The 2015 super-resolution microscopy roadmap

3. A guide to super-resolution fluorescence microscopy

4. Resolution and contrast enhancement of subtractive second harmonic generation microscopy with a circularly polarized vortex beam

5. Intensity Weighted Subtraction Microscopy Approach for Image Contrast and Resolution Enhancement

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