Ultrashort pulsed laser tools for testing of semiconductor elements hardness to single event effects, caused by cosmic heavy charged particles
Author:
Publisher
SPIE
Reference18 articles.
1. Multilayer Fluorescent Type Optical Information-Carrying Medium;Kurbangaeev,2012
2. Subbandgap laser-induced single event effects: carrier generation via two-photon absorption
3. Comparison of Single Event Transients Generated at Four Pulsed-Laser Test Facilities-NRL, IMS, EADS, JPL
4. Self-stabilization of ultrashort pulses emitted by a neodymium phosphate glass laser
5. Effects of beam spot size on the correlation between laser and heavy ion SEU testing
Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. The Optimal Estimation of Single Event Effects Sensitivity Parameters Using a Focused Laser Source and Heavy Ion Cyclotron on Example of a Library of Analog IP Units;2021 International Siberian Conference on Control and Communications (SIBCON);2021-05-13
2. Influence of ultrashort laser drilling on magnetic and transport characteristics of HTS tapes;Superconductor Science and Technology;2019-06-06
3. The laser-only single-event effects test method for space electronics based on ultrashort-pulsed-laser 'local irradiation';Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XVIII;2018-02-19
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3