Modern approaches for a design and development of optoelectronic measuring systems-Reference-Cited by-同舟云学术

Modern approaches for a design and development of optoelectronic measuring systems

Published:2016-04-27 Issue: Volume: Page:
ISSN:0277-786X
Container-title:Optical Modelling and Design IV
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Author:

Nekrylov Ivan S.,Korotaev Valery V.,Denisov Victor M.,Kleshchenok Maksim A.

Publisher

SPIE

Reference13 articles.

1. Nilsen, R. B. and Lu, X. J., “Retroreflection technology,” in [European Symposium on Optics and Photonics for Defence and Security], 47–60, International Society for Optics and Photonics (2004).

2. Optical properties of a retroreflecting sheet

3. Measurement and characterization of angular reflectance for cube-corners and microspheres

4. Wavefront correcting properties of corner-cube arrays

5. Optical truss and retroreflector modeling for picometer laser metrology;Hines,1993

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